• LOFT test station for testing TV cameras at field/depot conditions is offered. 

July   2011

• List of international distributors  was updated.

• New versions of JT systems for boresight applications are offered.

March   2011

• New version of NVS  for testing night vision sights is offered. New set of refractive collimators is used. Light source was modified, too.

February   2011

• New version of SIMAT dynamic target simulator is offered. The simulator is now fully computerized. Sophisticated scenarios can be simulated.

December  2010

• The book:   TESTING THERMAL IMAGERS - Practical guide   was added in  the educational section devoted to testing thermal imagers. This book is a gift made by Inframet to international community of peoples interested in technology of thermal imaging.

October  2010

• We  are proud to inform you that INFRAMET (www.inframet.com)  has become recently   the only company on the world market capable to manufacture high-tech test equipment for testing all types of electro-optical surveillance systems (thermal imagers, CCD/CMOS/ICCD/EBAPS cameras, night vision devices, laser range finders, laser designators, laser illuminators, multi-sensor surveillance system, SWIR imagers) and components of such surveillance systems (image intensifier tubes, IR FPA sensors, CCD/CMOS/ ICCD/EBAPS sensors, IR optics, visible optics, SWIR optics). In order to celebrate this unique achievement by our young dynamic company we plan to launch a scheme of free demonstrations of technical capabilities of our test systems in 2011 year. The most important and unique feature of this plan is possibility for free evaluation of our test systems.

• The companies/scientific centers/university groups qualified to our demonstration  plan will be able to evaluate one of  our test systems free of charge for a period up to half an year at their  own facilities (only costs of transport are expected to be covered by the borrower).   It means practically that for up to half an year  a test system of commercial value often over one hundred thousand USD can be used free of charge.
  December 20, 2010 is the deadline for presenting interest in taking part in the FES program (free evaluation scheme). If interested please send us email with the following data: institution, address, the hierarchical list of interesting test systems, suggested time needed to evaluate, and other data useful to evaluate the applicant institution (see evaluation criterions below). The letter should be confirmed by the management of applicant institution.    

• The  following criterions shall  used to evaluate applications to FES program:

1. Is the Applicant from a country/region where Inframet products are unknown or little known?
2. Is the Applicant a well known manufacturer of electro-optical systems/components with whom Inframet  can potentially  start/continue  a long term cooperation?
3. Is the Applicant a well known educational/scientific institutions with whom Inframet  can potentially start/continue  a long term cooperation?
4. Can the Applicant be  treated as a local opinion-making body?
5. Can the Applicant potentially buy Inframet  test system after positive evaluation (no confirmation is needed at this stage)?
6. Can the Applicant potentially help Inframet  in marketing its  products?
7. Level of possible logistical problems (distance, customs requirements, can Inframet engineers control online the  test system at applicant facilities during demonstration and training)
8. Educational level of the Applicant (how much training is needed, is there a risk that the equipment can be damaged)
9. Can Inframet potentially start cooperation with the Applicant within framework of EU scientific programs? 
10. Estimated trust level to the applicant institution (is there any risk that we equipment shall not be returned in time, is the applicant a well known institution of good public opinion)
11. Ratio of number  applicants to the number of available test systems. 

• Applicants approved to FES program shall be contacted not later than January 15,2011.